Senior Reliability Engineer
Lockheed Martin
Jun 2008 - Sep 2013 (5 years 4 months)
Calculated probability of spacecraft system performance life for electronic parts, circuits, mechanical hardware, thermal control subsystems, propulsion, and software for satellite bus/instruments for NASA, NOAA, DARPA, Air Force, Navy, and IRAD space programs; performed probability trade studies that affect major subsystem design changes to improve reliability; methods include statistics (e.g. linear regression, confidence bounds, Student’s t-test, Weibull/Arrhenius analysis), redundancy and cut set analysis, circuit part stress analysis, and accelerated life test data/field test data analysis; identified potential failures and documented in Failure Modes and Effects Analysis and Boolean Fault Tree Analysis, and collaborated with designers